Archive  2010 2009 2008 2007 2006 2005 2004 2003 2002 2001 2000Newsletters Spring '08 Winter '07 Summer '07 Spring '07 New Year '07 Winter '06Click here to sign up and receive eNews newsletters by email |
 |
News & Press Releases - [Main Index] Anritsu demonstrates a 3G LTE Virtual Network Demo 2009-10-13 Japan – October 7, 2009 - A 3G LTE test system which creates a virtual 3G LTE network will be displayed in Japan this week. Anritsu will display the system at CEATEC JAPAN 2009 running until 10th October in Chiba-city.The test system hooks up the MF6900A Fading Simulator with the MD8430A Signalling Tester to allow the creation of a 3G LTE virtual network. This offers throughput fading tests to be undertaken with uplink speeds of 50 megabytes and downlink speeds of 100 megabytes. The system operates in a 2 by 2 MIMO environment.
Click for high resolution image Anritsu will also demonstrate 3G LTE receiver and transmission evaluation tests using MG3700A vector signal generators and MS269xA-series signal analyzers in conjunction with LTE chipsets, base stations and terminals. LTE is the next-generation mobile communication service planned to be introduced in 2010, by telecom carriers in Japan, Europe and the United States. Since LTE is an IP-based wireless technology, its application is expected to spread, from mobile phones to wide range of fields such as personal computers, car electronics and digital home appliances. Anritsu will introduce LTE measurement solutions realized by the latest technologies and partnerships with global customers at the Anritsu Booth, at the very period LTE research and development races towards 2010.
About Anritsu
Jonathan Borrill |
